Unlike Scanning Electron Microscopy that bounces electrons off the surface of a sample to produce an image, Transmission Electron Microscopes (TEMs) shoot the electrons completely through the sample.

The FIB uses a variation on the Everhart-Thornley (ET) secondary electron detector. Secondary ions are also produced in the beam-specimen volume and can be used for imaging; however, the Hitachi ...

Scientists have calculated how it is possible to look inside the atom to image individual electron orbitals. An electron microscope can't just snap a photo like a mobile phone camera can. The ability ...

It may not have won an Oscar, but the tiny electron has finally made its film debut. A new video shows how an electron rides on a light wave after just having been pulled away from an atom. This is ...

(Nanowerk News) A novel technique that nudges single atoms to switch places within an atomically thin material could bring scientists another step closer to realizing theoretical physicist Richard ...